Estimating expected error rates of neural network classifiers in small sample size situations: a comparison of cross-validation and bootstrap.
Naonori UedaRyohei NakanoPublished in: ICNN (1995)
Keyphrases
- cross validation
- small sample size
- expected error
- model selection
- sample size
- generalization error
- training set
- support vector
- high dimensionality
- linear discriminant analysis
- hyperparameters
- microarray data
- face recognition
- high dimensional
- learning machines
- vc dimension
- high dimensional data
- feature selection
- worst case
- uniform distribution
- machine learning
- lower bound
- unsupervised learning
- dimensionality reduction
- data sets
- nearest neighbor
- support vector machine
- data points
- ls svm
- optimal solution
- learning algorithm
- feature extraction