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Studies on SEE Characteristic and Hardening Techniques of CMOS SRAM with Sub-micro Feature Sizes.
Xing-hua He
Cong Zhang
Yong-liang Zhang
Huan-zhang Lu
Published in:
SCSS (2) (2008)
Keyphrases
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power consumption
low power
random access memory
database
feature vectors
low cost
high speed
data transmission
power supply
analog vlsi
real time
genetic algorithm
case study
image features
low voltage
vlsi circuits