Investigation of error- and drift sources in a capacitive sensor system for sub-nanometer displacement measurement.
Roumen NojdelovDirk VoigtArthur S. van de NesStoyan N. NihtianovPublished in: ICST (2015)
Keyphrases
- error accumulation
- measurement error
- error rate
- data acquisition
- information sources
- sensor networks
- sensor fusion
- error bounds
- data sources
- databases
- sensor data
- real time
- multiple sources
- multi sensor
- blind source separation
- optical flow
- knowledge sources
- image sensor
- computer vision
- linear complexity
- external information
- three dimensional
- data sets