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Introduction to special issue SAP 2012.

Rachel McDonnellVeronica Sundstedt
Published in: ACM Trans. Appl. Percept. (2012)
Keyphrases
  • special issue
  • ai edam
  • international journal
  • ecml pkdd
  • applied intelligence
  • special section
  • business intelligence
  • data analysis
  • artificial neural networks
  • knowledge discovery