Defect Imaging Enhancement through Optimized Shape Factors of the RAPID Algorithm Based on Guided Wave Beam Pattern Analysis.
Yonghee LeeYounho ChoPublished in: Sensors (2021)
Keyphrases
- pattern analysis
- learning algorithm
- detection algorithm
- dynamic programming
- objective function
- segmentation algorithm
- image processing
- optimal solution
- k means
- genetic algorithm
- digitized images
- shape model
- cost function
- image analysis
- search space
- video sequences
- similarity measure
- computer vision
- real world
- control system
- preprocessing
- worst case
- computational intelligence
- simulated annealing
- expectation maximization
- pattern recognition
- matching algorithm
- ct images
- intensity profile