Method to estimate profile of threshold voltage degradation in MOSFETs due to electrical stress.
Yeohyeok YunJi-Hoon SeoDonghee SonBongkoo KangPublished in: Microelectron. Reliab. (2018)
Keyphrases
- detection method
- experimental evaluation
- objective function
- preprocessing
- pairwise
- prior knowledge
- significant improvement
- high precision
- dynamic programming
- clustering method
- classification accuracy
- low voltage
- method assumes
- estimation algorithm
- mathematical model
- segmentation algorithm
- model selection
- high accuracy
- support vector machine
- neural network
- cost function
- control system
- similarity measure
- clustering algorithm