Endurance Evaluation on OTS-PCM Device using Constant Current Stress Scheme.
Wei-Chih ChienL. M. GignacY. C. ChouC. H. YangN. GongH. Y. HoC. W. YehH. Y. ChengW. KimI. T. KuoE. K. LaiC. W. ChengL. BuziA. RayC. S. HsuR. L. BruceMatthew BrightSkyH. L. LungPublished in: IRPS (2022)