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Decision fusion approach for detecting unknown wafer bin map patterns based on a deep multitask learning model.
Jaeyeon Jang
Gyeong Taek Lee
Published in:
Expert Syst. Appl. (2023)
Keyphrases
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decision fusion
computer vision
probabilistic model
data mining
image processing
decision trees
image segmentation
prior knowledge
high resolution
high order
multitask learning