A sensitivity analysis of microarray feature selection and classification under measurement noise.
Herman M. J. SontropRené van den HamPerry D. MoerlandMarcel J. T. ReindersWim F. J. VerhaeghPublished in: GENSiPS (2009)
Keyphrases
- sensitivity analysis
- measurement noise
- feature selection and classification
- microarray
- high dimensionality
- high throughput
- gene expression
- managerial insights
- gene expression data
- microarray data
- kalman filtering
- gene expression profiling
- gene expression analysis
- microarray data analysis
- feature selection
- gene networks
- gene selection
- microarray images
- cancer classification
- gene expression profiles
- data sets
- neural network
- feature ranking
- selected features
- high dimensional
- pattern recognition
- image processing
- machine learning