Software defect prediction using semi-supervised learning with dimension reduction.
Huihua LuBojan CukicMark Vere CulpPublished in: ASE (2012)
Keyphrases
- dimension reduction
- semi supervised learning
- unsupervised learning
- unlabeled data
- semi supervised
- labeled data
- feature extraction
- principal component analysis
- feature selection
- supervised learning
- high dimensional
- low dimensional
- singular value decomposition
- machine learning
- feature space
- ensemble learning
- dimensionality reduction
- active learning
- random projections
- linear discriminant analysis
- learning problems
- text categorization
- transfer learning
- learning models
- cluster analysis
- high dimensional data
- training data
- object recognition
- support vector
- high dimensionality
- labeled and unlabeled data
- sample selection bias
- class imbalance
- data sets
- preprocessing
- data analysis
- face recognition
- neural network