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Optimizing Time-of-Arrival Localization Solutions for Challenging Industrial Environments.
Tom Van Haute
Bart Verbeke
Eli De Poorter
Ingrid Moerman
Published in:
IEEE Trans. Ind. Informatics (2017)
Keyphrases
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real world
neural network
industrial applications
information retrieval
steady state
benchmark problems
optimal solution
machine learning
evolutionary algorithm
image registration
ambient intelligence
similar problems
technology transfer
source localization
accurate localization