Data Engineering for the Analysis of Semiconductor Manufacturing Data
Peter D. TurneyPublished in: CoRR (2002)
Keyphrases
- data collection
- data processing
- data analysis
- image data
- data sets
- computer systems
- data quality
- raw data
- database
- complex data
- data objects
- statistical analysis
- neural network
- knowledge discovery
- high quality
- experimental data
- data structure
- feature selection
- databases
- data sources
- prior knowledge
- synthetic data
- data acquisition
- database systems
- original data
- noisy data
- training data