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Microarmature Solder Surface Detection: An Adaptive Central Region Sample Selection Anchor Free Framework.

Wei ZhangXia FangChengjun WuMei WangJie WangDingcheng ZhangQiang Miao
Published in: IEEE Trans. Instrum. Meas. (2023)
Keyphrases
  • object detection
  • sample selection
  • neural network
  • pattern recognition
  • active learning
  • multi class
  • semi supervised