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Extraction of Electrical- and Noise-Parameters of Fully-Differential-Amplifier Subcircuits.

Yuxiang HuangLeonid Belostotski
Published in: IEEE Access (2019)
Keyphrases
  • maximum likelihood
  • input data
  • missing data
  • information extraction
  • parameter values
  • additive noise
  • parameter estimation
  • noisy environments
  • random noise
  • noise variance