Oversampling Based on Data Augmentation in Convolutional Neural Network for Silicon Wafer Defect Classification.
Uzma BatoolMohd Ibrahim ShapiaiNordinah IsmailHilman FauziSyahrizal SallehPublished in: SoMeT (2020)
Keyphrases
- data sets
- raw data
- database
- training data
- image data
- original data
- data analysis
- convolutional neural network
- high dimensional data
- data processing
- data sources
- prior knowledge
- data structure
- data points
- databases
- complex data
- data distribution
- synthetic data
- computer systems
- data collection
- small number
- knowledge discovery
- high quality
- experimental data
- high speed
- social networks
- neural network
- integrated circuit