Empirical-Statistics Analysis for Zero-Failure GaAs MMICs Life Testing Data.
Zheng-Liang HuangFa-Xin YuShu-Ting ZhangHao LuoPing-Hui WangYao ZhengPublished in: IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2009)
Keyphrases
- data analysis
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- input data
- original data
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- artificial neural networks