Robust Deep Learning for IC Test Problems.
Animesh Basak ChowdhuryBenjamin TanSiddharth GargRamesh KarriPublished in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2022)
Keyphrases
- test problems
- deep learning
- knapsack problem
- benchmark problems
- optimization problems
- branch and bound algorithm
- tabu search
- solution quality
- machine learning
- unsupervised learning
- unsupervised feature learning
- optimal solution
- mental models
- computationally efficient
- higher order
- computer vision
- genetic algorithm
- weakly supervised
- neural network