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One-scan algorithm for arbitrarily oriented 1-D morphological opening and slope pattern spectrum.
Jan Bartovsky
Petr Dokládal
Eva Dokládalová
Michel Bilodeau
Published in:
ICIP (2012)
Keyphrases
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pattern spectrum
computationally efficient
k means
similarity measure
cost function
expectation maximization
computational complexity
search space
input data
segmentation algorithm
clustering method
frequent patterns
matching algorithm
similarity metric