Fast statistical analysis of rare circuit failure events via subset simulation in high-dimensional variation space.
Shupeng SunXin LiPublished in: ICCAD (2014)
Keyphrases
- statistical analysis
- high dimensional
- low dimensional
- parameter space
- high speed
- rare events
- high dimensional spaces
- mathematical model
- search space
- sparse data
- high dimensional data
- lower dimensional
- higher dimensional
- input space
- event detection
- kernel space
- gene expression data
- similarity search
- dimensionality reduction
- manifold learning
- neural network
- variable selection
- temporal information
- dimensional data
- nearest neighbor
- shape space
- data points
- statistical analyses
- feature space