Image Based Metrology for Quantitative Analysis of Local Structural Similarity of Nanostructures.
P. RavindranNicola J. FerrierS. M. ParkP. F. NealeyPublished in: ICIP (4) (2007)
Keyphrases
- quantitative analysis
- structural similarity
- structural information
- qualitative analysis
- image quality assessment
- camera calibration
- boundary conditions
- qualitative evaluation
- qualitative and quantitative analysis
- computer vision
- structural similarity index
- quality metrics
- similarity computation
- high level
- correlation coefficient
- multiresolution