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Regret Analysis for Performance Metrics in Multi-Label Classification: The Case of Hamming and Subset Zero-One Loss.

Krzysztof DembczynskiWillem WaegemanWeiwei ChengEyke Hüllermeier
Published in: ECML/PKDD (1) (2010)
Keyphrases
  • multi label classification
  • multi label
  • data analysis
  • clustering algorithm
  • image segmentation
  • face recognition
  • bayesian networks
  • pairwise