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Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels.

Seyoung ParkJaeyeon JangChang Ouk Kim
Published in: J. Intell. Manuf. (2021)
Keyphrases
  • multi label
  • learning models
  • learning algorithm
  • training data
  • support vector
  • learning tasks
  • incremental learning
  • discriminative features