A model of a 300mm wafer fabrication line.
Philip L. CampbellDarius RohanEdward A. MacNairPublished in: WSC (1999)
Keyphrases
- computational model
- experimental data
- information retrieval
- probability distribution
- formal model
- statistical model
- parameter estimation
- management system
- high level
- probabilistic model
- data sets
- scheduling problem
- dynamic programming
- markov random field
- multi agent systems
- bayesian networks
- learning algorithm
- neural network