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Statistical Soft Error Rate (SSER) Analysis for Scaled CMOS Designs.

Huan-Kai PengHsuan-Ming HuangYu-Hsin KuoCharles H.-P. Wen
Published in: ACM Trans. Design Autom. Electr. Syst. (2012)
Keyphrases
  • error rate
  • statistical analysis
  • test set
  • lower error rates
  • information retrieval
  • training data
  • rough sets
  • low cost
  • correct recognition rate