An Edge-Based Registration Method for Locating Defects on PCB Films.

Yih-Chih Chiou Yu-Kang Zhang

Published in: IPCV (2006)

Keyphrases

detection method
high accuracy
computational cost
objective function
significant improvement
high precision
support vector machine
segmentation method
mutual information
clustering method
electron micrographs
similarity measure
image matching
image registration
probabilistic model
cost function
multiresolution