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Characterization and Analysis of Bit Errors in 3D TLC NAND Flash Memory.

Nikolaos PapandreouHaralampos PozidisThomas P. ParnellNikolas IoannouRoman A. PletkaSasa TomicPatrick BreenGary A. TresslerAaron FryTimothy Fisher
Published in: IRPS (2019)
Keyphrases
  • flash memory
  • data analysis
  • file system
  • database systems
  • data structure
  • computational complexity
  • high dimensional
  • quality assessment
  • storage devices
  • solid state