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Variability Analysis of SBOX With CMOS 45 nm Technology.

Abhishek KumarSuman Lata TripathiUmashankar Subramaniam
Published in: Wirel. Pers. Commun. (2022)
Keyphrases
  • statistical analysis
  • quantitative analysis
  • data sets
  • data mining
  • case study
  • image processing
  • xml documents
  • imaging systems