Terahertz imaging detectors in a 65-nm CMOS SOI technology.

Erik Öjefors Neda Baktash Yan Zhao Richard Al Hadi Hani Sherry Ullrich R. Pfeiffer

Published in: ESSCIRC (2010)

Keyphrases

metal oxide semiconductor
image sensor
imaging systems
silicon on insulator
image analysis
object detection
low power
high resolution
imaging technology
image processing
high speed
image acquisition