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Algorithm-Driven Advances for Scientific CT Instruments: From model-based to deep learning-based approaches.

S. V. VenkatakrishnanK. Aditya MohanAmirkoushyar ZiabariCharles A. Bouman
Published in: IEEE Signal Process. Mag. (2022)
Keyphrases
  • deep learning
  • learning algorithm
  • expectation maximization
  • k means
  • medical images
  • similarity measure
  • probabilistic model
  • domain specific
  • segmentation algorithm
  • segmentation method