Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level.
Yassir ArezkiRong SuVille HeikkinenFrançois LepretePavel PsotaYouichi BitouChristian SchoberCharyar-Mehdi SouzaniBandar Abdulrahman Mohammed AlzahraniXiangchao ZhangYohan KondoChristof PrussVit LedlNabil AnwerMohamed Lamjed BouaziziRichard K. LeachHichem NouiraPublished in: Sensors (2021)