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Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level.

Yassir ArezkiRong SuVille HeikkinenFrançois LepretePavel PsotaYouichi BitouChristian SchoberCharyar-Mehdi SouzaniBandar Abdulrahman Mohammed AlzahraniXiangchao ZhangYohan KondoChristof PrussVit LedlNabil AnwerMohamed Lamjed BouaziziRichard K. LeachHichem Nouira
Published in: Sensors (2021)
Keyphrases
  • free form
  • free form surfaces
  • high quality
  • implicit polynomial
  • camera calibration
  • motion parallax
  • neural network
  • surface patches