Login / Signup
Heavy-ion irradiation study in SOI-based and bulk-based junctionless FinFETs using 3D-TCAD simulation.
N. Vinodhkumar
Y. V. Bhuvaneshwari
K. K. Nagarajan
R. Srinivasan
Published in:
Microelectron. Reliab. (2015)
Keyphrases
</>
simulation study
statistical analysis
empirical studies
experimental study
study proposes
decision trees
hidden markov models