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A Fast Leakage-Aware Green's-Function-Based Thermal Simulator for 3-D Chips.

Hameedah SultanSmruti R. Sarangi
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2020)
Keyphrases
  • infrared
  • test bed
  • high speed
  • integrated circuit
  • information retrieval
  • website
  • simulation model
  • simulation environment