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Treatment of Ventricular Assist Device Test Bench Data for Prediction of Failures and Improved Intrinsic Reliability.

Jeferson C. DiasJônatas C. DiasEdinei P. LegaspeRodrigo Lima StoeterauFabrício JunqueiraNewton MaruyamaLucas Antônio MoscatoPaulo E. MiyagiDiolino J. Santos Filho
Published in: DoCEIS (2019)
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