Failure Tests on 64 Mb SDRAM in Radiation Environment.
Stefano BertazzoniGian Carlo CardarilliD. PiergentiliMarcello SalmeriAdelio SalsanoDomenico Di GiovenaleG. C. GrandeP. MarinucciS. SperandeiS. BartalucciG. MazzengaM. RicciV. BidoliD. de FrancescoPiergiorgio PicozzaA. RovelliPublished in: DFT (1999)