Login / Signup

An analysis: traditional semiconductor lithography versus emerging technology (nano imprint).

Walter J. TrybulaRobert L. WrightKranthi Mitra AdusumilliRandy K. Goodall
Published in: WSC (2005)
Keyphrases
  • data mining
  • data sets
  • databases
  • rapid development
  • neural network
  • image analysis
  • cost effective
  • case study
  • similarity measure
  • expert systems
  • data processing
  • personal computer