Simulation Acceleration of Bit Error Rate Prediction and Yield Optimization of 3D V-NAND Flash Memory.
Yohan KimSoyoung KimPublished in: IEEE Access (2023)
Keyphrases
- flash memory
- bit error rate
- ofdm system
- garbage collection
- analytical model
- solid state
- file system
- main memory
- embedded systems
- computer simulation
- random access
- disk drives
- database systems
- signal to noise ratio
- multipath
- b tree
- data storage
- simulation model
- channel estimation
- channel coding
- fading channels
- mathematical model
- orthogonal frequency division multiplexing
- modulation scheme
- storage devices
- wireless channels
- estimation algorithm
- small size
- code division multiple access
- database management systems