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Partitioning Circuits for Improved Testability.

Sandeep N. BhattFan R. K. ChungArnold L. Rosenberg
Published in: Algorithmica (1991)
Keyphrases
  • data sets
  • artificial intelligence
  • digital libraries
  • improved algorithm
  • delay insensitive
  • real time
  • three dimensional
  • high speed
  • simulated annealing
  • quantum computing