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Reliability Qualification Challenges of SOCs in Advanced CMOS Process Nodes (Invited).
Shou-En Liu
Jian Li
Deepak Nayak
Amit Marathe
Kaushik Balamukundhan
Vishal Gosavi
Ajaykumar Prajapati
Baha Kilic
Mengzhi Pang
Arpit Mittal
Published in:
IRPS (2022)
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