Influence of gate length on the performance of GaAs MESFETs by a physical I-V model.
M. BobboVittorio M. N. PassaroAgostino GiorgioAnna Gina PerriPublished in: ICECS (1999)
Keyphrases
- mathematical model
- management system
- computational model
- parameter estimation
- influence factors
- simulation model
- statistical model
- database
- theoretical analysis
- objective function
- neural network
- cost function
- high level
- knowledge base
- machine learning
- hierarchical structure
- neural network model
- bayesian framework
- formal model
- physical systems
- data sets