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Evaluating RFID opportunity through process analysis.

Davide BusatoMarcello FeraRaffaele IannoneVincenzo ManciniMassimiliano M. Schiraldi
Published in: Int. J. RF Technol. Res. Appl. (2013)
Keyphrases
  • process model
  • low cost
  • quantitative analysis
  • neural network
  • data mining
  • information retrieval
  • data analysis
  • image analysis
  • load balancing