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Localization and physical analysis of a complex SRAM failure in 90nm technology.
Zhongling Qian
Frank Siegelin
Birgit Tippelt
Stefan Müller
Published in:
Microelectron. Reliab. (2006)
Keyphrases
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statistical analysis
real world
pattern recognition
data analysis
low cost
power consumption
real time
computer vision
high level
image analysis
complex systems
efficient implementation