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Using gate-level side channel parameters for formally analyzing vulnerabilities in integrated circuits.
Imran Hafeez Abbassi
Faiq Khalid
Osman Hasan
Awais Mehmood Kamboh
Published in:
Sci. Comput. Program. (2019)
Keyphrases
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integrated circuit
countermeasures
parameter values
levels of abstraction
expectation maximization
information security
input data
maximum likelihood
parameter settings
software systems
smart card
input parameters
printed circuit boards
security vulnerabilities
nano scale