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Phase-shift ambiguity in microwave dielectric properties measurements.

Samir TrabelsiAndrzej W. KraszewskiStuart O. Nelson
Published in: IEEE Trans. Instrum. Meas. (2000)
Keyphrases
  • phase shift
  • waveguide
  • data sets
  • machine learning
  • artificial intelligence
  • computer vision
  • three dimensional
  • evolutionary algorithm
  • structural properties
  • measurement error
  • geometrical properties