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S-Parameter Model of Three Parallel Interconnect Lines Generating Negative Group-Delay Effect.
Fayu Wan
Ningdong Li
Blaise Ravelo
Qizheng Ji
Junxiang Ge
Published in:
IEEE Access (2018)
Keyphrases
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probabilistic model
computational model
experimental data
high level
generation process
probability distribution
conceptual model
mathematical model
theoretical analysis
group membership
parallel computing
parameter values
neural network
sufficient conditions
prior knowledge
similarity measure
learning algorithm