Multi-product lot merging/splitting algorithms for a semiconductor wafer fabrication.
June-Young BangJae-Hun KangBong-Kyun KimYeong-Dae KimPublished in: WSC (2008)
Keyphrases
- wafer fabrication
- computationally efficient
- recently developed
- orders of magnitude
- computational cost
- optimization problems
- data sets
- theoretical analysis
- benchmark datasets
- times faster
- neural network
- learning algorithm
- product quality
- graph theory
- machine learning
- computational efficiency
- worst case
- computational complexity
- reinforcement learning
- image processing