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Large Volume Metrology Instrument Selection and Measurability Analysis.

J. E. MuelanerBin CaiPaul G. Maropoulos
Published in: DET (2009)
Keyphrases
  • automatic analysis
  • multiresolution
  • real world
  • machine learning
  • information systems
  • data analysis
  • preprocessing
  • camera calibration
  • quantitative analysis