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Statistical Electromigration analysis of a chip with the consideration of a within-die temperature map.

Ted SunAyhan A. MutluMahmud Rahman
Published in: ISCAS (2013)
Keyphrases
  • statistical analysis
  • quantitative analysis
  • image analysis
  • data sets
  • neural network
  • learning algorithm
  • artificial intelligence
  • image reconstruction
  • maximum a posteriori