Enhancing Classification Accuracy with the Help of Feature Maximization Metric.
Jean-Charles LamirelPublished in: ICTAI (2013)
Keyphrases
- classification accuracy
- feature set
- feature subset
- feature selection
- image features
- neural network
- naive bayes
- distance measure
- feature vectors
- bayesian networks
- training set
- training data
- metric space
- data sets
- neighborhood structure
- feature space
- feature extraction
- decision trees
- computer vision
- improvement in classification accuracy