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Class Imbalance Wafer Defect Pattern Recognition Based on Shared-Database Decentralized Federated Learning Framework.
Yong Zhang
Rukai Lan
Xianhe Li
Jingzhong Fang
Zuowei Ping
Weibo Liu
Zidong Wang
Published in:
IEEE Trans. Instrum. Meas. (2024)
Keyphrases
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database
pattern recognition
class imbalance
learning algorithm
learning tasks
learning scheme
image processing
database systems
learning process
active learning
supervised learning
data sets
multi class
non stationary
reinforcement learning
error prone
cost sensitive
class distribution
machine learning