A THz signal source with integrated antenna for non-destructive testing in 28nm bulk CMOS.

Wouter Steyaert Patrick Reynaert

Published in: A-SSCC (2015)

Keyphrases

amplitude modulation
signal processing
low cost
power consumption
silicon on insulator
phased array
low power
cmos technology
high speed
single chip
delay insensitive
frequency domain
nm technology
digital camera
multispectral
low voltage
high frequency